Test handler for DUT's

Details Test handler for DUT's Test handler for DUT's

1995-12-04

1998-12-08

Raevis, Robert

Measuring and testing

Inspecting

324760, G01R 3126

Patent

active

058472932

ABSTRACT:
A handling system for devices under test (DUTs), i.e. semiconductor chips. A rotatable platform is provided which platform has a plurality of boats or nests. The DUTs are inserted in the boats. The platform carrying the DUTs is indexed through a plurality of treatment stations to precondition the chips specifically to bring the chip to a test temperature. At a test station, the chip is removed from the boat and inserted into a manufacturer's test head. The chip is tested, returned to the boat and indexed to a treatment station(s) downstream of the test head where is ultimately removed for further processing.

REFERENCES:
patent: 4604572 (1986-08-01), Horiuchi et al.
patent: 4926118 (1990-05-01), O'Connor et al.
patent: 5563521 (1996-10-01), Crumly
patent: 5574383 (1996-11-01), Saito et al.

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