Test handler emulation

Details Test handler emulation Test handler emulation

2006-11-28

2006-11-28

Hollington, Jermele (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07142002

ABSTRACT:
A method of testing circuit chips includes providing test chips, the test chips being circuit chips to be tested, emulating a first type of test handler positioner for a circuit chip coupling device that is configured to couple to the first type of test handler, and using a test handler positioner connected to the circuit chip coupling device to couple the circuit chip coupling device to a selected test chip, to move the test chip to a desired test location, and to remove the test chip from the test location.

REFERENCES:
patent: 5708222 (1998-01-01), Yonezawa et al.
patent: 6439631 (2002-08-01), Kress
patent: 6978541 (2005-12-01), Feltner et al.

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