Miscellaneous active electrical nonlinear devices – circuits – and – Specific input to output function – Combining of plural signals
Patent
1995-05-03
1996-07-30
Callahan, Tiimothy P.
Miscellaneous active electrical nonlinear devices, circuits, and
Specific input to output function
Combining of plural signals
371 223, 371 225, 348126, 382149, 324763, 2503581, G06F 7556
Patent
active
055415474
ABSTRACT:
A latch-up pulse generator system includes a latch-up pulse generator coupled to first and second power supplies, for outputting JEDEC-standardized first and second output pulse trains. The generator includes a master clock, digital frequency dividers, and digitally controlled delay circuitry for outputting the two pulse trains. The first pulse train is a square-wave signal with a repetition rate of about two seconds. The second pulse train has a pulse width that is digitally controllable between about 0.2 .mu.s and 5 .mu.s. The delay between the fall-time of the second pulse train and the fall-time of the first pulse train is variably controlled between about 1 .mu.s and one second in 1 .mu.s steps. The amplitude and current output of each pulse train may range from 0 to perhaps 15 VDC at a current level of about 5 A. For power pin latch-up testing, the two pulse trains are combined to produce a composite pulse train. Signal and/or power pins of a CMOS device under test may be analyzed. Digital control permits a user to halt latch-up at any point in the latch-up phenomenon for purposes of observation, analysis and recordation. Preferably a generic emission microscope is used to observe the device under test.
REFERENCES:
patent: 4532534 (1985-07-01), Ford et al.
patent: 4633283 (1986-12-01), Avery
patent: 4672407 (1987-06-01), Nakagawa et al.
patent: 4870530 (1989-09-01), Hurst et al.
patent: 5170239 (1992-12-01), Hagino
patent: 5326994 (1994-07-01), Giebel et al.
patent: 5391898 (1995-02-01), Hagino
Callahan Tiimothy P.
Sun Microsystems Inc.
Wells Kenneth B.
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