Test generation of sequential circuits using software transforma

Details Test generation of sequential circuits using software transforma Test generation of sequential circuits using software transforma

1995-10-05

1996-11-12

Nguyen, Hoa T.

Excavating

371 221, G01R 3128

Patent

active

055747345

ABSTRACT:
A process for generating a test set for a sequential integrated circuit that includes performing a transformation on a software model of the circuit to provide a modified software model that should be more easily tested but that need not be functionally equivalent, and deriving a test set for the modified software model in conventional fashion. Thereafter, the derived test set is inverse mapped to derive a test set for the original sequential circuit. The transformation used essentially involves (1) the borrowing and/or returning registers at the primary inputs and/or primary outputs and (2) positioning the registers in the modified model as needed.

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