Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – With rotor
Patent
1989-04-06
1990-08-07
Eisenzopf, Reinhard J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
With rotor
324158P, G01R 3102
Patent
active
049471112
ABSTRACT:
A fixture for testing of an MMIC-containing package includes an alignment plate, a pogo-pin assembly, a waffleline support baseplate, and a pressure engagement assembly. The alignment plate contains a pattern of apertures that matches that of the pins of the MMIC-containing package and defines, with those pins, transmission lines having an impedance that effectively matches that of the internal interconnect to the MMICs within the package. The alignment plate is mounted atop a pogo-pin assembly, pogo-pins of which are aligned with signal conductors of the package, and which form transmission lines having an impedance effectively matching the impedance of the transmission lines through the alignment plate. The pogo-pin assembly engages a waffleline structure in a baseplate. The baseplate includes coaxial connectors that are coupled to channels of the waffleline and joined to the pogo-pins. A pressure engagement assembly is mounted upon the baseplate adjacent to the pogo-pin assembly for urging a MMIC-containing package into pressure contact with the alignment plate. As the package is brought into contact with the alignment plate, its signal conductors are aligned with and pass through the apertures through the plate, and press against the pogo-pins.
REFERENCES:
patent: 4321532 (1982-03-01), Luna
patent: 4352061 (1982-09-01), Matrone
patent: 4357062 (1982-11-01), Everett
patent: 4406373 (1983-09-01), Braden
patent: 4443756 (1984-04-01), Lightbody et al.
patent: 4504780 (1985-03-01), Marsella
patent: 4574236 (1986-03-01), Hechtman
patent: 4598456 (1986-07-01), McConnell
patent: 4695810 (1987-09-01), Heckaman et al.
patent: 4700132 (1987-10-01), Yarbrough et al.
patent: 4701702 (1987-10-01), Kruger
patent: 4705081 (1987-11-01), Birk et al.
patent: 4724377 (1988-02-01), Maelzer et al.
patent: 4837507 (1989-06-01), Hechtman
Higman Roger H.
Perkins Gilbert
Eisenzopf Reinhard J.
Harris Corporation
Nguyen Vinh P.
LandOfFree
Test fixture for multi-GHZ microwave integrated circuits does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test fixture for multi-GHZ microwave integrated circuits, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test fixture for multi-GHZ microwave integrated circuits will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-962592