Test fixture for integrated circuit chips

Details Test fixture for integrated circuit chips Test fixture for integrated circuit chips

1988-03-02

1990-01-30

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

333246, G01R 3102, G01R 106

Patent

active

048976016

ABSTRACT:
Apparatus and method are provided for making rf contact between the ground plane surface of a microwave-monolithic-integrated-circuit chip and a test fixture. The test fixture includes a chip support with a planar surface, a chip stop with a wedging surface, a clamp-release lever with a wedging surface, and a spring. The conductive ground plane surface of a MMIC chip is pressed against a planar surface with a contacting force that is a function of a clamping force that is applied to one of the wedging surfaces, and that is a function of angles of the wedging surfaces. Heat applied to the MMIC chip cooperates with the contacting force to provide a suitable rf connection between the ground plane surface of the chip and the planar surface of the test fixture.

REFERENCES:
patent: 3651434 (1972-03-01), McGeough et al.
patent: 3775644 (1973-11-01), Cotner et al.
patent: 4365195 (1982-12-01), Stegens
patent: 4480240 (1984-10-01), Gould
patent: 4567432 (1986-01-01), Buol et al.
patent: 4574235 (1986-03-01), Kelly et al.
patent: 4630875 (1986-12-01), Korsunsky et al
patent: 4689556 (1987-08-01), Cedrone
patent: 4747784 (1988-05-01), Cedrone
patent: 4758176 (1988-07-01), Abe et al.

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