Test fixture and method for testing a semi-finished chip...

Details Test fixture and method for testing a semi-finished chip... Test fixture and method for testing a semi-finished chip...

2007-01-19

2008-07-15

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C414S941000, C414S939000

Reexamination Certificate

active

07400158

ABSTRACT:
A test fixture has a base, a positioning board, multiple probes, a cushion board, multiple springs and multiple inner bolts. The base has a recess defined in the base. The positioning board is mounted in the recess. The probe is mounted on the positioning board and each probe has a top contacting end. The cushion board is mounted slidably in the recess and has a socket hole to hold a semi-finished chip package. The springs are mounted in the positioning board between the recess and the cushion board and press and bias the cushion board upward. The inner bolts are mounted slidably through the cushion and the springs and the are mounted securely in the base. The cushion board and springs reduce the impact from the semi-finished chip package to the probes so that the probes would not be damaged.

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