Test facility

Electricity: measuring and testing – Plural – automatically sequential tests

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Details

324 73R, 364579, G01R 1512

Patent

active

043994059

ABSTRACT:
A test facility comprises a transmitter and a receiver for an automatic test system for function testing of integrated circuits of different technologies, whereby the input and output of the test specimen are connected to the same test pin. In order to test circuits of different technological format, it is necessary to pre-program the output of the test facility to the respective characteristic level of the different circuit families. To this end, a transmitter contains a constant current source keyed by the inverted input signal with a TTL level related to zero volts, the constant current source being connected at its output to the input of an output stage provided with a dynamically variable constant current load. The input of the output stage is connected to the output of a programming circuit which, depending on the TTL levels applied to its two inputs, switches different resistors in circuit whose voltage drop influences the output level of the constant current source in such a manner that the output stage, due to different drive, exhibits the output level required for testing components having different technological formats. The transmitter stage is connected by way of a bidirectional line both to the input of a receiver including a comparison circuit and a memory post-connected thereto, and to the respective test pin. The invention is particularly suited for employment in automatic testing units for data processing devices.

REFERENCES:
patent: 3631229 (1971-12-01), Bens
patent: 4161029 (1979-07-01), Frye
patent: 4211915 (1980-07-01), Miller

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