Test error detection method and system

Details Test error detection method and system Test error detection method and system

2004-11-16

2008-10-14

Patel, Paresh (Department: 2829)

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

C324S765010

Reexamination Certificate

active

07436168

ABSTRACT:
According to one embodiment, a method of test error detection for a wafer having a plurality of rows of integrated circuit (IC) chips is provided. The method includes determining that a first number of IC chips that are indicated as failing a test has increased from a first row to a second row immediately following the first row at least by a first threshold. The method also includes determining that a second number of IC chips that are indicated as failing the test has decreased from a previous row to a second row immediately following the previous row at least by a second threshold. The method also includes indicating that a group of one or more rows located between the first row and the second row includes one or more IC chips that have been tested incorrectly.

REFERENCES:
patent: 6906341 (2005-06-01), Byun et al.
patent: 2005/0186690 (2005-08-01), Chen et al.
patent: 2005/0212538 (2005-09-01), Oborny
Automated Wafer Analysis Using Wafer Map Autocorrelation□□Hopcraft, Geoffrey□□ARFTG Conference Digest, 1998. Computer-Aided Design and Test for High-Speed Electronics 52nd□□Dec. 3-4, 1998 pp. 82-87.

Affiliated with

Also associated with

Rating

Test error detection method and system does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test error detection method and system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test error detection method and system will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3990285