Test equipment for a low current IC

Details Test equipment for a low current IC Test equipment for a low current IC

1989-12-11

1991-01-15

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 251, G01R 3128, G01R 3122

Patent

active

049856723

ABSTRACT:
In equipment which measures current of ICs for testing them, there are provided a first current detector for detecting current which flows through an IC under test when applying voltage from a voltage source to a power source terminal of the IC to which a smoothing capacitor is connected, a buffer amplifier for extracting the voltage to be applied to the power source terminal, a compensating capacitor which is supplied with the output of the buffer amplifier and provides a charging/discharging current equivalent to that which flows through the smoothing capacitor, a second current detector for detecting the charging/discharging current of the compensating capacitor, and a subtractor for subtracting the output of the second current detector from the output of the first current detector. By subtracting the charging/discharging current of the compensating capacitor from the current flowing from the voltage source to the IC under test, the current flowing to the IC under test can be measured without being affected by the charging/discharging current of the smoothing capacitor.

REFERENCES:
patent: 3988672 (1976-10-01), Cowart
patent: 4456880 (1984-06-01), Warner et al.
patent: 4459693 (1984-07-01), Prang et al.
patent: 4710704 (1987-12-01), Ando
patent: 4771428 (1988-09-01), Acuff et al.
patent: 4820974 (1989-04-01), Katsura et al.

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