Test equipment

Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element

Reexamination Certificate

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Details

C324S756010

Reexamination Certificate

active

07876118

ABSTRACT:
Provided is a test apparatus that tests a device under test, comprising a pattern generating section that generates a test pattern for testing the device under test; a signal supplying section that supplies the device under test with a test signal corresponding to the test pattern; a trigger generating section that supplies a trigger signal to an external instrument connected to the device under test; and a synchronization control section that outputs, to the trigger generating section, a synchronization signal instructing generation of the trigger signal, based on at least a portion of the test pattern generated by the pattern generating section.

REFERENCES:
patent: 5072417 (1991-12-01), Aton et al.
patent: 6574168 (2003-06-01), Hayashi
patent: 6990613 (2006-01-01), Doi et al.
patent: 3066072 (2000-02-01), None
patent: 2005-91037 (2005-04-01), None
patent: 2006-300894 (2006-11-01), None
patent: 2007-315828 (2007-12-01), None
patent: 2009-025138 (2009-02-01), None
patent: 2006109463 (2006-10-01), None
patent: 2007077839 (2007-07-01), None
patent: 2008117468 (2008-10-01), None
“Search Report of PCT Counterpart Application” issued on May 11, 2010, p. 1-p. 8.

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