Test enabling circuit for enabling overhead test circuitry in pr

Details Test enabling circuit for enabling overhead test circuitry in pr Test enabling circuit for enabling overhead test circuitry in pr

1986-03-21

1988-03-22

Eisenzopf, Reinhard J.

Electricity: measuring and testing

Plural, automatically sequential tests

324158R, 324110, G01R 1512

Patent

active

047331682

ABSTRACT:
A test enabling circuit for actuating specific testing circuitry contained within a programmable device, whereby the test enabling circuit and a portion of the normal operational circuits of the device share a common input pin. Because of the dual functionality of the common input pin, the test enabling circuit is designed to respond to a specified test signal, which is either of an opposing polarity, or of a higher magnitude of the same polarity with respect to the normal operational signal. The enabling circuit includes several IGFET devices arranged such that the noise margin of the enabling circuit may be adapted for accommodating varying environments of noise. ESD circuitry is included to protect the testing and test enabling circuits against electrostatic discharge.

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