Test device with test parameter adaptation

Details Test device with test parameter adaptation Test device with test parameter adaptation

2006-03-22

2009-06-23

Karlsen, Ernest F (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C702S085000

Reexamination Certificate

active

07550988

ABSTRACT:
A test device for testing a device under test, wherein the test device is adapted for providing a connection to a central controller, the test device comprising a first interface for receiving a test procedure activation signal from the central controller, and a processor for performing a test procedure on the basis of a test procedure data upon receipt of the test procedure activation signal, wherein the processor is capable of adjusting the test procedure upon receipt of a feedback signal from the device under test.

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patent: WO 2004/072669 (2004-08-01), None

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