Test device of analog/digital converter

Coded data generation or conversion – Converter calibration or testing

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341155, H03M 110

Patent

active

053050037

ABSTRACT:
A test device of an A/D converter contained in a one-chip microcomputer capable of testing all failures in a digital part of the A/D converter by testing the digital part at a function test step carried out by the microcomputer. The test device comprises an A/D test load register for storing a digital value corresponding to an analog value to be tested. In an A/D self-test mode, data from the A/D test load register is stored in an A/D data register via a control logic, upon setting of an A/D start flag. Storing of the data is achieved, in place of an output from a comparator based on an analog input signal. As the data is read, it is possible to test analog and digital parts of the A/D converter individually, at a function test step, thereby verifying all failures in the A/D converter.

REFERENCES:
patent: 4364027 (1982-12-01), Murooka
patent: 4612533 (1986-09-01), Evans
patent: 4763105 (1988-08-01), Jenq
patent: 4896282 (1980-01-01), Orwell
patent: 4937575 (1990-06-01), Kummer
patent: 5012241 (1991-04-01), Kuttner
patent: 5053770 (1991-10-01), Mayer et al.

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