Test device for multi-contact integrated circuit

Details Test device for multi-contact integrated circuit Test device for multi-contact integrated circuit

1996-08-29

1998-04-21

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324762, 439 68, G01R 3102, H01R 909

Patent

active

057421714

ABSTRACT:
Herein disclosed is a test device for testing an integrated circuit (IC) chip having a plurality of side edge portions each provided with a set of contact members. The test device comprises a socket base on which the IC chip is to be set, a plurality of contact units each including a contact support member and a set of socket contact members supported by the contact support member, and a contact retainer detachably mounted on the socket base to have the contact units retained with the socket contact members being held in contact with the contact members of the IC chip while the IC chip is set on the socket base. Each of the contact units can be removed from the socket base and replaced by a new contact unit if the socket contact members partly become fatigued and damaged, thereby making it possible to facilitate the maintenance of the test device.

REFERENCES:
patent: 4547031 (1985-10-01), Korsumsky
patent: 4962356 (1990-10-01), Eberlein et al.
patent: 5302853 (1994-04-01), Volz et al.
patent: 5306167 (1994-04-01), Nagumo
patent: 5410258 (1995-04-01), Bowers et al.
patent: 5451165 (1995-09-01), Cearley-Cabbiness et al.

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