Test device for an electronic chip

Details Test device for an electronic chip Test device for an electronic chip

1991-06-10

1993-08-03

Beausoliel, Jr., Robert W.

Excavating

371 223, G06F 1100

Patent

active

052336123

ABSTRACT:
A test device for testing integrated electronic chips (EC) includes: a first processor; an interface for interfacing the first processor with a plurality of other circuits; and a second processor coupled to the first processor. In the test device, at least one of the plurality of other circuits is formed on the integrated electronic chip being tested. The interface includes a first scan path having a first string of first cells formed on the integrated electronic chip. The first string of first cells includes a plurality of serially connected first read buffers, a respective one of the first read buffers being provided in each first cell, for latching data and for transferring data between the at least one circuit of the plurality of other circuits and the first processor. A second scan path includes a second string of second cells, which includes a plurality of serially connected second read buffers, a respective one of the second read buffers being provided in each second cell for latching data and for transferring data between the second processor and the second scan path. The second processor and the first processor are coupled together via a serial interconnection connected between the first and second read buffers. A data transfer device serially transfers latched data from the first read buffer to said second read buffer and visa-versa, at a predetermined transfer rate such that one data transfer is provided at each of a plurality of processor steps of said second processor.

REFERENCES:
patent: 4506322 (1985-03-01), Leigh
patent: 4558232 (1985-12-01), Simpson
patent: 4607366 (1986-08-01), Stadlmeier et al.
patent: 4674089 (1987-06-01), Poret et al.
patent: 4868822 (1989-09-01), Scott et al.
patent: 5056013 (1991-10-01), Yamamoto
IBM Technical Disclosure Bulletin, vol. 23, No. 6, Nov. 1980, p. 2438, Armonk, US; L. L. Hart, et al., "Circuit card diagnosis at machine speed" *Whole article, especially paragraph 2*.
International Test Conference 1987 Proceedings; Sep. 1-3, 1987 pp. 717-723.
Proceedings of the IEEE 1989 Custom Integrated Circuits Conference; Town & Country Hotel, San Diego, Calif., May 15-18, 1989; pp. 22.4.1-22.4.4.

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