Test device and method for testing electronic device and semicon

Details Test device and method for testing electronic device and semicon Test device and method for testing electronic device and semicon

1989-10-19

1991-10-01

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 731, 371 214, 371 251, G01R 3128

Patent

active

050536982

ABSTRACT:
A test device for an electronic device includes a pattern generating circuit, a plurality of comparators and a memory. The pattern generating circuit generates at least one input pattern. The electronic device under test is supplied with the input pattern and generating a corresponding ouput signal. The comparators are connected to the electronic device under test and are supplied with the output signal therefrom. The comparators compare the output signal with an expected output signal with mutually different timing of comparison. The memory stores the comparison results supplied from the comparators. Characteristics of the electronic device under test are obtained from the comparison results stored in the memory.

REFERENCES:
patent: 4893072 (1990-01-01), Matsumoto

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