Test device and method facilitating aggressive circuit design

Details Test device and method facilitating aggressive circuit design Test device and method facilitating aggressive circuit design

1995-12-07

1999-12-21

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, G01R 3122

Patent

active

060054069

ABSTRACT:
A test device is formed on a chip which allows the susceptibility to failure of functional circuitry formed on the chip to be tested. The test device allows aggressive design of chips which include sensitive circuitry, such as precharged dynamic logic, by testing whether deviations from the design specification introduced during manufacturing of the chip are sufficient to cause failure of the functional circuitry.

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