Test device and its method for testing DSP ICs in the finished p

Details Test device and its method for testing DSP ICs in the finished p Test device and its method for testing DSP ICs in the finished p

1997-05-30

1999-06-08

Canney, Vincent P.

Excavating

G06F 1100

Patent

active

059109572

ABSTRACT:
A test device for testing a plurality of Digital Signal Processor Integrated Circuits Incorporated as a finished product in a digital video apparatus comprises: a plurality of Digital Signal Processor Integrated Circuits (DSP ICs) for processing a signal from a test signal generator as a digital signal and outputting the digitally processed signal, the test signal generator being disposed at an input end of the plurality of DSP ICs; a monitor for monitoring an output from the DSP IC being tested. It is possible to check in a simple manner the operating state of each IC connected to other DSP ICs as well as the production and assembly state of the PCB as a finished digital video apparatus. Furthermore, it is possible to check for damage of the parts or an error which may be generated during connection of the ICs to the lines on the PCB in the manufacturing of the products as well as defects caused during shipping of assembled IC components in a DSP apparatus.

REFERENCES:
patent: 5726996 (1998-03-01), Chakradhar et al.

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