Test data formatter

Details Test data formatter Test data formatter

1994-02-17

1994-12-27

Beausoliel, Jr., Robert W.

Excavating

G01R 3128, G06F 1100

Patent

active

053772032

ABSTRACT:
A formatting program (30) receives format data from a detector file (32) and test data from a test data file (34) in order to form a formatted test data file (36). The format test data file (36) is used by an automatic test generation program (38) to perform testing on one or more module in an integrated circuit.

REFERENCES:
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patent: 4727312 (1988-02-01), Fulks
patent: 4766595 (1988-08-01), Gollomp
patent: 4862399 (1989-08-01), Freeman
patent: 4903267 (1990-02-01), Arai
patent: 4907180 (1990-03-01), Smith
patent: 5063383 (1991-11-01), Bobba
J. M. Dinwiddie, et al, "Test Pattern Methodology For VSI/VLSI Module Level Testing and In-Circuit Card Testing", IBMTDB, vol. 26, No. 11, Apr. 1984, pp. 5909-5910.
E. P. Hsieh, et al, "Test Generation System For Mixed Technologia", IBMTDB, vol. 22, No. 8A, Jan. 1980, pp. 3214-3218.
R. M. Peters, "Automatic Generation of Bit Patterns For Array Testing", IBMTDB, vol. 25, No. 713, Dec. 1982 pp. 4024-4028.
"Parallel Module Testing Application Note", Texas Instruments Inc., 1988, Jun.

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