Data processing: generic control systems or specific application – Specific application – apparatus or process – Product assembly or manufacturing
Reexamination Certificate
2006-07-11
2008-09-09
Kosowski, Alexander J (Department: 2128)
Data processing: generic control systems or specific application
Specific application, apparatus or process
Product assembly or manufacturing
C700S109000, C700S110000
Reexamination Certificate
active
07424336
ABSTRACT:
Disclosed is a test data analyzing method and system for use in estimation of a defect cause of a product, such as, an integrated circuit, a liquid crystal display, an optical transceiver, a thin film magnetic head, etc., which is fabricated through plural processes. The estimation of a defect cause is achieved by selecting a wafer number to be analyzed, reading test data, reading fabrication line data, counting frequency of machine codes by wafers, grouping test data by machine codes or frequencies, comparing test data distributions between groups by machine codes, and comparing results between machine codes.
REFERENCES:
patent: 6535776 (2003-03-01), Tobin et al.
patent: 6643592 (2003-11-01), Loman et al.
patent: 6804563 (2004-10-01), Lafaye de Micheaux
patent: 6909927 (2005-06-01), Nguyen
patent: 7174281 (2007-02-01), Abercrombie
patent: 7337033 (2008-02-01), Ontalus et al.
patent: 2003/0182252 (2003-09-01), Beinglass et al.
patent: 11-045919 (1999-02-01), None
patent: 2000-012640 (2000-01-01), None
Konishi Junko
Ono Makoto
Antonelli, Terry Stout & Kraus, LLP.
Hitachi High - Technologies Corporation
Kosowski Alexander J
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