Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-04-05
2005-04-05
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S1540PB
Reexamination Certificate
active
06876219
ABSTRACT:
A test system and a method for testing an integrated circuit determines the synchronization of the integrated circuit by a current measurement rather than conventionally in the time domain. The present principle is based on the insight that the current consumption of a DUT given simultaneous driving of data on a common data channel from the DUT and from the tester is dependent on a superposition of both signals. Accordingly, highly accurate conclusions about the phase angle of the two signals with respect to one another can be drawn from the present current consumption. The principle presented can be applied particularly to DDR-SDRAMs with a low outlay.
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Daehn, W.: “Demodulation Based Testing of Off-Chip Driver Performance”, European Test Workshop, Informal Digest, May 29-Jun. 1, 2001, IEEE, 2002, pp. 42-47.
Locher Ralph E.
Nguyen Vinh P.
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