Test clock generating apparatus

Details Test clock generating apparatus Test clock generating apparatus

2008-07-22

2008-07-22

Richards, N. Drew (Department: 2816)

Miscellaneous active electrical nonlinear devices, circuits, and

Signal converting, shaping, or generating

Clock or pulse waveform generating

C327S293000, C327S407000

Reexamination Certificate

active

11192279

ABSTRACT:
A test clock generating apparatus is provided in the invention. The test clock generating apparatus includes an at-speed clock generator and a multiplexer. The at-speed clock generator is for receiving a reference clock signal and a scan chain enable signal and outputting an at-speed clock signal. The frequency of the at-speed clock signal is substantially the same with that of the reference clock signal. The multiplexer is for receiving the at-speed clock signal and a scan chain clock signal and outputting a test clock signal according to the scan chain enable signal. The frequency of the reference clock signal is higher than that of the scan chain clock.

REFERENCES:
patent: 5524114 (1996-06-01), Peng
patent: 5783960 (1998-07-01), Lackey
patent: 6452435 (2002-09-01), Skergan et al.
patent: 7131041 (2006-10-01), Ozaki
patent: 7197725 (2007-03-01), Takeoka et al.

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