Test clip with standard interface

Electrical connectors – Coupling part having handle or means to move contact... – To move contact with respect to similar contact

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Details

439 70, H01R 13629

Patent

active

057885249

ABSTRACT:
A test clip is described with contacts (50) for engaging leads (26) of an IC (integrated circuit) device, wherein the contacts have lower lead-contacting parts (56) arranged in a single row (62) at a predetermined lead spacing S, and have header pins (60) lying in a header arrangement that allows connection to a standard instrument connector (40). Each contact has an intermediate portion (70) where the contact has a first offset part (72) extending in a longitudinal direction (L) by a distance S/2, and has a second lower offset part that extends partially in a lateral direction (M) by a lateral distance S. The upper first offset part extends horizontally, with 90.degree. angles (76, 78) at it opposite ends, so the contact can be installed by pressing on a shoulder (90) of the first offset part. The first offset part with 90.degree. angles is formed by initially stamping the contact from sheet metal to form a stamped part with such angles and such first offset part. The second, lower offset part extends at an angle (B) from the vertical of about 45.degree. so its opposite ends form angles of 45.degree., with the second offset part resulting from bending of the stamped contact. The contact intermediate portions (which contains the two offset parts) lie in a recess (104) at the top of the connector housing and are held in place by a header insert (106).

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