Electricity: measuring and testing – Testing potential in specific environment – Voltage probe
Patent
1976-04-16
1977-10-25
Rolinec, Rudolph V.
Electricity: measuring and testing
Testing potential in specific environment
Voltage probe
324158F, 339 75MP, 339 74R, 324158P, G01R 3102, G01R 106
Patent
active
040558002
ABSTRACT:
For testing electronic chips, an integral plastic test clip comprises a pair of opposed jaws that are pivotal relative to each other about a junction and that are provided with (1) inner elongated grooves radiating from the junction for the snug reception of the similarly located terminals of the chip, (2) openings through which the clip communicates with the grooves to guide probes into direct contact with selected terminals, and (3) indicia at the openings for facilitating accurate terminal selection while precluding inadvertent probe and terminal contacts.
REFERENCES:
patent: 3412327 (1968-11-01), Murray
patent: 3551878 (1970-12-01), Rossman
patent: 3555488 (1971-01-01), McIver et al.
patent: 3611259 (1971-10-01), Palecek
patent: 3968433 (1976-07-01), Dobarganes
Fisk Charles S.
Jung Dietrich
Jung Dietrich
Rolinec Rudolph V.
Sunderdick Vincent J.
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