Test circuitry, systems and methods

Details Test circuitry, systems and methods Test circuitry, systems and methods

1991-07-19

1997-01-21

Beausoliel, Jr., Robert W.

Excavating

G01R 3128

Patent

active

055965830

ABSTRACT:
Test circuitry (90) is provided which includes a multiplexer (118) for selectively receiving multiple bit control words defining test functions to be executed by said test circuitry and for outputting data from said test circuitry. A plurality of digital data inputs (96) are provided for receiving multiple bit words of digital data and a plurality of analog data inputs (98) are provided for receiving analog data. A register (120) is coupled to multiplexer (118) for storing a one of the multiple bit words received by multiplexer (118). Control circuitry (122) is coupled to register (120) for controlling execution of the test function defined by the control word being held in register (120). First test circuitry (112) is coupled to digital data inputs (96) and control circuitry (122) for passing digital data words received at digital data inputs (96) to multiplexer (118) for output in response to a first control word of said control words being held in register (120).

REFERENCES:
patent: 4769632 (1988-09-01), Work et al.
patent: 4815033 (1989-03-01), Harris
patent: 4831623 (1989-05-01), Terzian
patent: 5003256 (1991-03-01), Merrill
patent: 5017809 (1991-05-01), Turner
patent: 5084874 (1992-01-01), Whetsel, Jr.
patent: 5093910 (1992-03-01), Tulpule et al.
Texas Instruments Incorporated "TMS340 70-20 Color Palette", Production Data, 1986 pp. 1-15.
Brooktree "BT459" Product Data Book 1989, 1989 pp. 5.85 through 5.115.
Brooktree "RAMDAC Products" Winter 1990 Product Selection Guide 1990, pp. 9-15.

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