Test circuitry for testing fuse link programmable memory devices

Details Test circuitry for testing fuse link programmable memory devices Test circuitry for testing fuse link programmable memory devices

1986-03-21

1987-10-06

Karlsen, Ernest F.

Electricity: measuring and testing

Measuring, testing, or sensing electricity, per se

With rotor

324 73R, 324550, 371 21, G01R 3102

Patent

active

046985891

ABSTRACT:
A testing circuit for testing fuse elements in programmable memory devices. The circuit provides for testing whether the fuses have the proper resistance, both after manufacturing and after programming of the memory device. The testing circuit includes a current varying means which may include either a variable resistance or a variable current sink. The variable resistance is connected to a fuse element to form a voltage divider with the same. A sensing amplifier is connected at a node therebetween for sensing the current through the fuse element and, thus, the resistance of the same. The variable current sink provides variable current levels, thereby achieving the same above results.

REFERENCES:
patent: 3712537 (1973-01-01), Carita
patent: 4502140 (1985-02-01), Proebsting
patent: 4612630 (1986-09-01), Rosier
patent: 4625311 (1986-11-01), Fitzpatrick et al.
patent: 4626713 (1986-12-01), Lee

Affiliated with

Also associated with

Rating

Test circuitry for testing fuse link programmable memory devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test circuitry for testing fuse link programmable memory devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test circuitry for testing fuse link programmable memory devices will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2119989