Test circuit for watch LSI

Details Test circuit for watch LSI Test circuit for watch LSI

1982-09-23

1985-09-03

Miska, Vit W.

Horology: time measuring systems or devices

Chronological

With manually actuated display

368 87, G04C 1700, G04C 1900

Patent

active

045389233

ABSTRACT:
A test circuit for watch IC capable of setting an operating mode with the operations of a plurality of switches has a ROM for deciding next operating mode in response to the outputs of said switching circuit including the switches and the outputs of flipflips for holding a present operating mode.
A signal from a test terminal sets an initial state and provides the predetermined data instead of the outputs of flipflops to the ROM whereby an operator can set an arbitrary operating mode readily in a short time.

REFERENCES:
patent: 4063409 (1977-12-01), Bayliss
patent: 4150537 (1979-04-01), Mochizuki et al.
patent: 4386423 (1983-05-01), Sasaki et al.

Affiliated with

Also associated with

Rating

Test circuit for watch LSI does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test circuit for watch LSI, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test circuit for watch LSI will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-611074