Test circuit for use in a semiconductor apparatus

Details Test circuit for use in a semiconductor apparatus Test circuit for use in a semiconductor apparatus

2011-06-14

2011-06-14

Velez, Roberto (Department: 2858)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07960994

ABSTRACT:
A test circuit that senses a misaligned probe during a test includes a first power control section that senses voltage levels of a plurality of sensing lines and controls power supplied to a lower circuit section provided below a part of a pad group, and a second power control section that selectively provides an internal voltage in response to a sensing result of the first power control section.

REFERENCES:
patent: 5818249 (1998-10-01), Momohara
patent: 7212019 (2007-05-01), Schneegans et al.
patent: 2005-333128 (2005-12-01), None
patent: 2006-343113 (2006-12-01), None
patent: 2007-003252 (2007-01-01), None
patent: 1019990013060 (1999-02-01), None
patent: 1020050110304 (2005-11-01), None
patent: 1020070057378 (2007-06-01), None

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