Test circuit for turn-on and turn-off delay measurements

Details Test circuit for turn-on and turn-off delay measurements Test circuit for turn-on and turn-off delay measurements

1982-07-06

1984-12-18

Strecker, Gerard R.

Electricity: measuring and testing

Plural, automatically sequential tests

331 46, 331 57, 331DIG3, 340653, G01R 1702, G01R 2902, G01R 3128

Patent

active

044892721

ABSTRACT:
A test circuit that is particularly suitable for inclusion on an LSI chip when testing a new technology or process. The circuit will enable accurate determination of the effects of loading on the turn-on and turn-off delays of one or more logic circuits on the chip. These determinations are based upon a comparison of the periods of different signals obtainable from the test circuit.

REFERENCES:
patent: 4063080 (1977-12-01), Eichelberger
patent: 4392105 (1983-07-01), McLeod

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