Test circuit for signal input circuit having threshold

Details Test circuit for signal input circuit having threshold Test circuit for signal input circuit having threshold

1993-09-10

1995-10-17

Cosimano, Edward R.

Excavating

371 211, 371 225, 371 214, 340577, G01R 1900

Patent

active

054597340

ABSTRACT:
A test circuit for testing a signal input circuit having a threshold, an operational amplifier 3, for example, which converts voltages of input signal into a binary signal and supplies it to a logic circuit, a register 8, for example, is provided with signal lines 91, 92 connecting an input end and an output end of the register 8 through a switch 9. The test circuit judges a threshold of the operational amplifier 3 on the basis of voltage of a signal inputted to the operational amplifier 3 and a value of an output signal outputted from the operational amplifier 3 through the signal line 91, the switch 9, and the signal line 92 by turning switch 9 on. It is possible to perform testing at high speed without software processing. It is also possible to make the occupied area on one chip small when a plurality of signal input circuits are provided on the chip.

REFERENCES:
patent: 3665461 (1972-05-01), Gnagi et al.
patent: 4855669 (1989-08-01), Mahoney
patent: 4922184 (1990-05-01), Rosenstein et al.

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