Test circuit for MOS devices

Electricity: measuring and testing – Plural – automatically sequential tests

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

324 73PC, G01R 1512

Patent

active

043981461

ABSTRACT:
A test circuit for use in an MOS device includes two inputs, a first input which is responsive to a test signal of opposite polarity to that of the supply voltage, and a second input which is responsive to a test signal of the same polarity as that of the supply voltage but of a substantially higher magnitude than that of the supply voltage. The test circuit is enabled only when both the opposite polarity signal on the first input and the higher magnitude signal on the second input occur. In this manner a substantial immunity to spurious voltage transients of either polarity is obtained while permitting the test circuit and the circuits on the same MOS device being tested to share common terminals.

REFERENCES:
patent: 3772595 (1973-11-01), De Wolf
patent: 4339710 (1982-07-01), Hapke

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Test circuit for MOS devices does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Test circuit for MOS devices, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test circuit for MOS devices will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-589336

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.