Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-03-29
2011-03-29
Nguyen, Ha Tran T (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C345S087000
Reexamination Certificate
active
07915906
ABSTRACT:
A test device for detecting malfunction of a liquid crystal display device, and also provide a liquid crystal display device incorporated with such test device. The test device comprising a comparator circuit for detecting which of the rows or columns of the lines is selected, an encoder circuit receiving the detection result from the comparator circuit, a plurality of bus lines and a read-out circuit reading the voltage level of the bus lines from the encoder circuit to determine if the encoded number is identical with the number of the selected row or column line, wherein the comparator circuit, the encoder circuit, and the read-out circuit being built in the same substrate as the liquid crystal display elements.
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patent: 6850085 (2005-02-01), Sakaguchi et al.
patent: 7746093 (2010-06-01), Cha
patent: 2004/0217773 (2004-11-01), Nara et al.
patent: 2005/0200377 (2005-09-01), Orii et al.
patent: 07-199220 (1995-08-01), None
patent: 2000-047255 (2000-02-01), None
PCT International Search Report of Counterpart PCT Application No. PCT/JP2006/309336.
Liu & Liu
Nguyen Ha Tran T
TPO Hong Kong Holding Limited
Vazquez Arleen M
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