Test circuit for large scale integrated circuits on a wafer

Details Test circuit for large scale integrated circuits on a wafer Test circuit for large scale integrated circuits on a wafer

1993-09-21

1995-08-29

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

3241581, 371 225, G01R 3128

Patent

active

054463955

ABSTRACT:
A test circuit for conducting a simultaneous test of a plurality of integrated circuits provided in dicing regions of a wafer. The test circuit has a pattern generator electrically connected to the integrated circuits through first interconnections for generating input signal patterns and subsequent transmission thereof to each of the integrated circuits and pattern compressor/comparator electrically connected to the integrated circuits through second interconnections for analyzing output signals fetched from the integrated circuits so as to conduct a simultaneous test of a plurality of the integrated circuits.

REFERENCES:
patent: 4956602 (1990-09-01), Parrish
patent: 4961053 (1990-10-01), Krug
patent: 5307010 (1994-04-01), Chiu
patent: 5315241 (1994-05-01), Ewers

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