Test circuit for and method of identifying a defect in an...

Details Test circuit for and method of identifying a defect in an... Test circuit for and method of identifying a defect in an...

2007-06-05

2007-06-05

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

Reexamination Certificate

active

11016473

ABSTRACT:
The embodiments of the present invention enable a new metal diagnosis pattern based on a production test pattern to quickly identify open and short circuits of metal lines which cannot be probed, such as the long lines of a programmable logic device, and to further isolates the fault location for physical failure analysis. According to one aspect of the invention, a circuit locally drives a plurality of metal long line segments to determine whether a defect in a line is a short circuit, or further to identify the location of an open circuit.

REFERENCES:
patent: 7068039 (2006-06-01), Parker
patent: 7075307 (2006-07-01), Williamson
U.S. Appl. No. 10/703,326, filed Nov. 7, 2003, Fan et al.

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