Test circuit for a semiconductor integrated circuit

Details Test circuit for a semiconductor integrated circuit Test circuit for a semiconductor integrated circuit

2008-07-28

2009-11-17

Tang, Minh N (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S765010, C365S189040, C365S230080

Reexamination Certificate

active

07619433

ABSTRACT:
A test circuit includes an output control section for generating a plurality of output buffer control signals in response to a plurality of data masking signals when a test mode signal is activated in read operation; and a data output buffer for masking some of data input and output pins in response to the plurality of output buffer control signals.

REFERENCES:
patent: 6252804 (2001-06-01), Tomita
patent: 6704229 (2004-03-01), Haraguchi et al.
patent: 7453744 (2008-11-01), Kang
patent: 2007/0018637 (2007-01-01), Kim et al.
patent: 2008/0013389 (2008-01-01), Kim et al.
patent: 2003-066108 (2003-03-01), None
patent: 1020000022569 (2000-04-01), None

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