Oscillators – With frequency calibration or testing
Reexamination Certificate
2006-07-05
2008-08-19
Chang, Joseph (Department: 2817)
Oscillators
With frequency calibration or testing
C327S261000
Reexamination Certificate
active
07414483
ABSTRACT:
A test circuit comprises a delay circuit11with controllable delay, a phase comparator circuit12for comparing the phases between the clock signal S0and a delay clock signal S1delayed from the clock signal S0by the delay circuit11,a meas counter13for counting the number of outputs of the prescribed comparison result from the phase comparator circuit12,a signal switching circuit14for switching an input signal to the delay circuit11from the clock signal S0to a delay signal satisfying an oscillation condition where the delay signal is received from the delay circuit11and developing a ring oscillator, and a frequency measuring circuit15for measuring an oscillation frequency when the ring oscillator is developed, the delay circuit11includes a variable delay circuit17with variable delay units connected to control the delay in each variable delay units independently.
REFERENCES:
patent: 6737926 (2004-05-01), Forbes
patent: 6781470 (2004-08-01), Rogerson
patent: 2002/0118071 (2002-08-01), Langston
patent: 2005/0110548 (2005-05-01), Suda et al.
patent: 2003-121505 (2003-04-01), None
patent: 1993-0008420 (1993-08-01), None
Chang Joseph
Nixon & Vanderhye P.C.
Sharp Kabushiki Kaisha
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