Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2005-03-29
2005-03-29
Nguyen, Vinh P. (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
06873173
ABSTRACT:
The invention relates to a test circuit configuration. Every gate terminal of a transistor to be tested is coupled to a gate voltage source in such a manner that the gate voltage can be measured and adjusted individually on every gate terminal. The source terminal of every transistor to be tested can be coupled to the source voltage source in such a manner that the source voltage can be measured and adjusted individually on every source terminal.
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Kollmer Ute
Linnenbank Carsten
Schaper Ulrich
Thewes Roland
Altera Law Group LLC
Nguyen Vinh P.
Stone Jeffrey R.
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