Test circuit and testing method for function testing of electron

Details Test circuit and testing method for function testing of electron Test circuit and testing method for function testing of electron

1996-02-23

2000-08-22

Karlsen, Ernest

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

365201, G01R 3128

Patent

active

061078158

ABSTRACT:
An apparatus for function testing of electronic circuits includes a tester array having a terminal. A test circuit has at least two resistor elements, a common circuit node connected to the resistor elements for connection to the terminal of the tester array, and terminals of the resistor elements each being remote from the circuit node for connection to a respective output of an electronic circuit to be tested. A testing method for function testing of electronic circuits with such an apparatus includes placing the electronic circuit into a state in which signals are present at an output of the electronic circuit to be tested. The electronic circuit is function tested with respect to a resultant signal being established at the common circuit node.

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patent: 4943765 (1990-07-01), Dupraz et al.
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patent: 5070297 (1991-12-01), Kwon et al.
patent: 5142449 (1992-08-01), Littlebury
patent: 5177439 (1993-01-01), Liu et al.

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