Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Reexamination Certificate
2007-02-21
2009-06-09
Dole, Timothy J (Department: 2831)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
C324S701000, C327S187000, C330S002000
Reexamination Certificate
active
07545156
ABSTRACT:
The test circuit according to the present invention includes: a plurality of light-receiving elements; a plurality of amplifiers, each of which converts, into a voltage, a photoelectric current supplied from one of the light-receiving elements; and an electric current supplying unit which supplies an electric current to each of the light-receiving elements and each of the amplifiers. In this test circuit, the electric current supplying unit selectively supplies an electric current to a first group of light-receiving elements and to a second group of light-receiving elements, the first group of light-receiving elements including light-receiving elements, out of the plurality of light-receiving elements, which are neither vertically nor horizontally adjacent to each other, and the second group of light-receiving elements including light-receiving elements, out of the plurality of light-receiving elements, which are vertically or horizontally adjacent to the light-receiving elements of the first group of light-receiving elements.
REFERENCES:
patent: 5321254 (1994-06-01), Yokogawa et al.
patent: 5425011 (1995-06-01), Kusano et al.
patent: 5585731 (1996-12-01), Tsuchida et al.
patent: 6316955 (2001-11-01), Shimamura et al.
patent: 6624405 (2003-09-01), Lau et al.
patent: 7335872 (2008-02-01), Fukuda et al.
patent: 2003/0011425 (2003-01-01), Buescher
patent: 64-23172 (1989-01-01), None
patent: 8-129046 (1996-05-01), None
patent: 9-69617 (1997-03-01), None
patent: 10-284707 (1998-10-01), None
patent: 11-110805 (1999-04-01), None
patent: 3203996 (2001-06-01), None
patent: 2002-299460 (2002-10-01), None
English language Abstract of JP 64-23172.
English language Abstract of JP 11-110805.
English language Abstract of JP 9-69617.
English language Abstract of JP 10-284707.
English language Abstract of JP 2002-299460.
English Language Abstract of Corresponding document JP 8-129046.
Chato Tetsuo
Fukuda Hideo
Kuroiwa Yousuke
Shimizu Yuzo
Taniguchi Masaki
Dole Timothy J
Greenblum & Bernstein P.L.C.
Natalini Jeff
Panasonic Corporation
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