Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2011-06-28
2011-06-28
Nguyen, Vinh P (Department: 2858)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S762020
Reexamination Certificate
active
07969171
ABSTRACT:
A test circuit and system for testing one or more electrical properties of an electronic circuit or other device under test (DUT) by applying and monitoring test signals to the DUT is disclosed. The test circuit can utilize a plurality of universal interface channel circuits in a single automated test system to provide a unique and flexible approach for testing electronic circuits or devices that has many advantages. A single data acquisition circuit can be coupled to one or more universal interface channel circuits. Each of the universal interface channel circuits can be independently commanded by the data acquisition circuit to provide one of a variety of test signals to a DUT as desired.
REFERENCES:
patent: 4646299 (1987-02-01), Schinabeck et al.
patent: 4746855 (1988-05-01), Wrinn
patent: 4760330 (1988-07-01), Lias, Jr.
patent: 4908576 (1990-03-01), Jackson
patent: 5101151 (1992-03-01), Beaufils et al.
patent: 5225834 (1993-07-01), Imai et al.
patent: 5357191 (1994-10-01), Grace
patent: 5406197 (1995-04-01), Mercier et al.
patent: 5504432 (1996-04-01), Chandler et al.
patent: 5570027 (1996-10-01), Stans et al.
patent: 6054863 (2000-04-01), Morrison et al.
patent: 6314538 (2001-11-01), Ochoa et al.
patent: 6453435 (2002-09-01), Limon, Jr. et al.
patent: 6542844 (2003-04-01), Hanna
patent: 6731217 (2004-05-01), Warner
patent: 6937006 (2005-08-01), West
patent: 7110905 (2006-09-01), Le et al.
patent: 7174490 (2007-02-01), Evans
patent: 7500162 (2009-03-01), Smith
patent: 2009/0192753 (2009-07-01), Salmon
Kelley Paul Douglas
Rouse Eric Wade
Dority & Manning P.A.
General Electric Company
Nguyen Vinh P
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