Test circuit and method of use thereof for the manufacture...

Details Test circuit and method of use thereof for the manufacture... Test circuit and method of use thereof for the manufacture...

2007-12-25

2007-12-25

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Lumped type parameters

C324S765010

Reexamination Certificate

active

11449197

ABSTRACT:
A test circuit for fabrication of transistors for Very Large Scale Integration (“VLSI”) processing and method of use thereof are described. Transistors are formed in an array. A first decoder is coupled to gates of the transistors and configured to selectively pass voltage to the gates. A second decoder is coupled to drain regions of the transistors and configured to selectively pass voltage to the drain regions of the transistors. A third decoder is coupled to source regions of the transistors and configured to selectively pass voltage to the source regions of the transistors. A fourth decoder is coupled to body regions of the transistors and configured to selectively pass voltage to the body regions of the transistors.

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