Test circuit

Details Test circuit Test circuit

2008-12-23

2010-12-21

Donovan, Lincoln (Department: 2816)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

For fault location

C324S765010, C324S527000, C324S532000

Reexamination Certificate

active

07855561

ABSTRACT:
A test circuit according to the present invention includes: a synthesis circuit that synthesizes a first test result signal output from a first test target circuit in response to a test instruction, and a second test result signal output from a second test target circuit in response to the test instruction; an inter-block delay generation circuit that delays the second test result signal with respect to the first test result signal; and a test result holding circuit that holds a synthesized test result signal every predetermined timing, the synthesized test result signal being output from the synthesis circuit.

REFERENCES:
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patent: 2003/0140244 (2003-07-01), Dahan et al.
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patent: 2003/0221152 (2003-11-01), Volkerink et al.
patent: 2004/0123118 (2004-06-01), Dahan et al.
patent: 2005/0144497 (2005-06-01), Song et al.
patent: 2007/0247936 (2007-10-01), Direnzo et al.
patent: 11-212816 (1999-08-01), None
patent: 2003-194886 (2003-07-01), None
patent: 2005-241287 (2005-09-01), None
patent: 2006-119023 (2006-05-01), None
Japanese Office Action dated Mar. 3, 2009 with Partial English-Language Translation.

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