Data processing: structural design – modeling – simulation – and em – Simulating electronic device or electrical system – Circuit simulation
Reexamination Certificate
2004-08-30
2008-07-01
Rodriguez, Paul (Department: 2123)
Data processing: structural design, modeling, simulation, and em
Simulating electronic device or electrical system
Circuit simulation
C703S017000
Reexamination Certificate
active
07395196
ABSTRACT:
Generation of test cases for functional verification of a complex system-under-test is achieved by the use of a probability matrix. The probability matrix represents a non-uniform distribution function of resource combinations used in the transactions, and can be created randomly, or by application of various types of testing knowledge. The matrix is used by a test generator for selecting resources that participate in a transaction involving an interconnect between different types of system components. Applying the inventive principles increases the quality of design verification by stimulation of both the system's resources and its internal interconnects, with almost no knowledge of the structure of the system.
REFERENCES:
Erik Jan Marinissen et al., “Challenges in Testing Core-Based System ICs” IEEE, 1999, pp. 104-109.
Asad A Ismaeel et al., “The Probability of Error Detection in Sequential Circuits Using Random Test Vectors” Journal of Electronic testing, pp. 245-256, 1991.
Lukai Cai et al., “Transaction Level Modeling: An Overview” CODES+ISSS, ACM, 1993 pp. 19-24.
Mike G. Bartley et al., “A Comparison of Three Verification Techniques: Directed Testing, Pseudo-Random Testing and PRoperty Checking” DAC, ACM, 2002, pp. 819-823.
A. Aharon, “Verification of the IBM RISC System/6000 by a dynamic biased pseudo-random test program generator”, IBM systems Journal, vol. 30, No. 4, 1991, pp. 527-538.
Osborne Luke
Rodriguez Paul
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