Test carrier for semiconductor integrated circuit and method of

Details Test carrier for semiconductor integrated circuit and method of Test carrier for semiconductor integrated circuit and method of

1996-07-24

1998-10-27

Karlsen, Ernest F.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

269 8, G01R 3102

Patent

active

058282246

ABSTRACT:
A holding apparatus of a semiconductor device had a configuration for putting a semiconductor device as a chip or a packaged semiconductor device between a first substrate and a second substrate and fitting magnets to the first substrate and magnetic pieces to the second substrate respectively, and the first substrate and the second substrate are fixed by attraction acted between the magnets and the magnetic pieces.

REFERENCES:
patent: 4038599 (1977-07-01), Bove et al.
patent: 4975637 (1990-12-01), Frankeny et al.
patent: 5351876 (1994-10-01), Belcher et al.
patent: 5412866 (1995-05-01), Wolth et al.

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