Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Patent
1995-09-21
1998-12-29
Ballato, Josie
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
324761, G01R 3102
Patent
active
058545581
ABSTRACT:
A test board used for testing a semiconductor device provided with projection electrodes includes a main board and testing electrodes. The testing electrodes are provided on the main board, each projecting upwardly from the main board. When the semiconductor device is tested, the testing electrodes are electrically connected to the projection electrodes by insertion of the testing electrodes into the projection electrodes. The semiconductor device is mounted on the main board to test the semiconductor device through the testing electrodes.
REFERENCES:
patent: 4801871 (1989-01-01), Tada et al.
patent: 5055778 (1991-10-01), Okubo et al.
patent: 5060843 (1991-10-01), Yasuzato et al.
patent: 5172851 (1992-12-01), Matsushita et al.
patent: 5326428 (1994-07-01), Farnworth et al.
patent: 5420520 (1995-05-01), Anschel et al.
patent: 5483741 (1996-01-01), Akram et al.
patent: 5500605 (1996-03-01), Chang
patent: 5521519 (1996-05-01), Faure et al.
Yuichi Nakamura, "Bare-chip burn-in test system," Electronics Fabricating technology in Japanese, vol.11 No.4, pp.27-31, 1995 (Month Unavailable).
Randal Reebuck, et al., "Performance Testing of a Non-Destructive Burn-In Interconnect system for Known Good Die, DieMate," Texas Instruments Technical Library, 1994 (Month Unavailable).
Moto'o Nakano, "A Probe for Testing Semiconductor Integrated Circuits and a Test Method Using Said Probe," 25 Mar. 1991, Japanese Patent Office Disclosure No. Hei 3-69131, Filing No. Hei 1-205301, Filing date Aug. 8, 1989.
Fujimori Jouji
Kodama Kunio
Matsuda Tatsuharu
Motooka Toshiyuki
Takahashi Syuichirou
Ballato Josie
Fujitsu Limited
Kobert Russell M.
LandOfFree
Test board for testing a semiconductor device and method of test does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Test board for testing a semiconductor device and method of test, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Test board for testing a semiconductor device and method of test will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1427088