Test board and process of testing wide word memory parts

Details Test board and process of testing wide word memory parts Test board and process of testing wide word memory parts

1996-05-29

1998-08-18

Karlsen, Ernest F.

Electricity: measuring and testing

Plural, automatically sequential tests

324760, 365201, 371 211, G01R 3102

Patent

active

057962464

ABSTRACT:
Wide word memory parts (608) are tested in a design for test "DFT" mode at elevated temperatures. The parts are mounted on test boards (600) and only the set of data I/O leads 0-3 active in the "DFT" mode, which is less than the total number of data I/O leads 0-15, connect to substrate terminals (604) that connect to tester receivers. This provides for using existing test equipment with only a change in the test boards (600) while obtaining a higher efficiency in testing a larger number of memory parts than if all the data I/O leads were connected to the receivers.

REFERENCES:
patent: 4975641 (1990-12-01), Tanaka et al.
patent: 5132614 (1992-07-01), Sakumoto et al.
patent: 5436910 (1995-07-01), Takeshima et al.

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