Test automation for business applications

Details Test automation for business applications Test automation for business applications

2006-11-21

2011-12-06

Chavis, John (Department: 2193)

Data processing: software development, installation, and managem

Software program development tool

Testing or debugging

Reexamination Certificate

active

08074204

ABSTRACT:
A test framework suited for use with distributed business applications allows developers to specify a test, or suite of tests, to be easily selected and executed. Execution of a test suite instantiates objects such as a test runner and a test result object that set up, activate, and observe a test cycle. Results may be forwarded to a variety of special-purpose listeners which evaluate variable and state changes and ultimately determine pass/fail metrics. Results from profilers may be used to determine code coverage for each of the tests performed by the suite. APIs allow integration of the test framework with other development processes such as a be source code management system. In one embodiment, new or changed source code may not be checked in until successfully passing a test cycle.

REFERENCES:
patent: 7062753 (2006-06-01), Ward et al.
patent: 7272822 (2007-09-01), Riggins et al.
patent: 7694181 (2010-04-01), Noller et al.
patent: 2004/0103396 (2004-05-01), Nehab
patent: 2004/0133880 (2004-07-01), Paternostro et al.
patent: 2004/0193940 (2004-09-01), Snyder et al.
patent: 2005/0166094 (2005-07-01), Blackwell et al.
patent: 2005/0193266 (2005-09-01), Subramanian et al.
patent: 2005/0204201 (2005-09-01), Meenakshisundaram et al.
patent: 2005/0256665 (2005-11-01), Hartmann et al.
patent: 2006/0026506 (2006-02-01), Kristiansen et al.
patent: 2006/0161833 (2006-07-01), Chandra et al.
patent: 2007/0234293 (2007-10-01), Noller et al.
patent: 2007/0234314 (2007-10-01), Godwin et al.
U.S. Appl. No. 11/541,473, Ferren et al.
U.S. Appl. No. 11/541,450, Ferren et al.
U.S. Appl. No. 11/540,910, Ferren et al.
U.S. Appl. No. 11/526,145, Ferren et al.
U.S. Appl. No. 11/364,573, Ferren et al.
U.S. Appl. No. 11/364,131, Ferren et al.
U.S. Appl. No. 11/364,130, Ferren et al.
U.S. Appl. No. 11/343,927, Ferren et al.
U.S. Appl. No. 11/343,745, Ferren et al.
U.S. Appl. No. 11/324,174, Ferren et al.
U.S. Appl. No. 11/292,323, Ferren et al.
U.S. Appl. No. 11/292,296, Ferren et al.
U.S. Appl. No. 11/292,207, Ferren et al.
U.S. Appl. No. 11/291,503, Ferren et al.
U.S. Appl. No. 11/214,459, Ferren et al.
U.S. Appl. No. 11/214,458, Ferren et al.
U.S. Appl. No. 11/214,449, Ferren et al.
“iTKO LISA™ 3 for J2EE”, iTKO, Inc., 2006, http://www.itko.com/site/docs/LISA3—for—J2EE.pdf#search=%22Unit%20Testing%20J2EE%20applications%20pdf%22.
Wittevrongel et al., “SCENTOR: Scenario-Based Testing of E-Business Applications”, IEEE, 2001, http://csdl2.computer.org/persagen/DLAbsToc.jsp?resourcePath=/dl/proceedings/&toc=comp/proceedings/wetice/2001/1269/00/1269toc.xml&DOI=10.1109/ENABL.2001.953386#search=%22IEEE%20unit%20test%20business%20application%22.
Xie et al., “Tool-Assisted Unit Test Selection Based on Operational Violations”, IEEE, 2003. http://ieeexplore.ieee.org/iel5/8780/27811/01240293.pdf?isNumber=.
Mayer et al., “Towards a BPEL unit testing framework”, ACM, 2006, http://portal.acm.org/citation.cfm?id=1145723&coll=ACM&dI=ACM&CFID=183132&CFTOKEN=29586780.
Albonesi, David H., “Dynamic IPC/Clock Rate Optimization”, 1998, pp. 282-292, 25thInternational Symposium on Computer Architecture, IEEE Computer Society.
Balasubramonian, Rajeev; Albonesi, David; Buyuktosunoglu, Alper; Dwarkadas, Sandhya, “Dynamic Memory Hierarchy Performance Optimization”, 2000, pp. 1-11, IEEE.
Balasubramonian, Rajeev; Albonesi, David; Buyuktosunoglu, Alper; Dwarkadas, Sandhya, “Memory Hierarchy Reconfiguration for Energy and Performance in General-Purpose Processor Architectures”, 2000, pp. 1-13, IEEE.
Juan, Toni; Sanjeevan, Sanji; Navarro, Juan J., “Dynamic History-Length Fitting: A Third Level Of Adaptivity For-Branch Prediction”, bearing a date of 1998, pp. 155-166, IEEE.
Veidenbaum, Alexander V.; Tang, Weiyu; Gupta, Rajesh; Nicolau, Alexandru; Ji, Xiaomei, “Adapting Cache Line Size to Application Behavior”, 1999, pp. 145-154, 13thInternational Conference on Supercomputing, ACM Press.

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