Test assist circuit for a semiconductor device providing fault i

Details Test assist circuit for a semiconductor device providing fault i Test assist circuit for a semiconductor device providing fault i

1988-01-11

1989-10-10

Smith, Jerry

Excavating

371 211, G06F 1100

Patent

active

048736864

ABSTRACT:
In a test assist circuit for a semiconductor device, an address input selector (14a) is so switched that an external address signal is supplied to an address decoder (4) to address a memory circuit (3), while an input data selector (14b) is so switched that external input data is stored in an input data register (5), to be stored in addressed memory elements. Information of the most significant bit of the input data register is stored in an input data information storage area (16), and information of the least significant bit of the address decoder is stored in an address decoder information storage area (15). Data read from the memory circuit is stored in an output data register (6), to be outputted to a data output terminal (9) with the information stored in the address decoder information storage area and that stored in the input data information storage area respectively. Thus, the input data information and the address decoder information added to the outputted data are so observed that a determination can be easily made as to whether the memory circuit is in failure or the test assist circuit is in failure, even if the data read from the memory circuit is in failure.

REFERENCES:
patent: 4631724 (1986-12-01), Shimizu
patent: 4667330 (1987-05-01), Kumagai
patent: 4672582 (1987-06-01), Nishimura
patent: 4701919 (1987-10-01), Naitoh
patent: 4726023 (1988-02-01), Carter
patent: 4730320 (1988-03-01), Hidaka
IEEE 1986 Custom Integrated Circuits Conference, "Advanced Testing Techniques for Structured Asic Products", by Rick Rasmussen et al., 1986, pp. 412-415.

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