Test arrangement including anisotropic conductive film for...

Details Test arrangement including anisotropic conductive film for... Test arrangement including anisotropic conductive film for...

2008-04-08

2008-04-08

Nguyen, Vinh P. (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S755090

Reexamination Certificate

active

07355431

ABSTRACT:
A testing apparatus and method for testing a semiconductor device, and more particularly a test arrangement for measuring a guaranteed power loss of a semiconductor module, not requiring the module to have on-board decoupling capacitors for the power loss test. The conventional pogo-pin array and test socket are replaced by a novel low cost anisotropic conductive elastomer and a low cost socket, the conductive polymer providing electrical communication between the socket and the module under test.

REFERENCES:
patent: 6204681 (2001-03-01), Nagatsuka et al.
patent: 6320747 (2001-11-01), Jahn et al.
patent: 6483331 (2002-11-01), Tamaru et al.
patent: 6799976 (2004-10-01), Mok et al.
“iP2003A, Synchronous Buck Multiplase Optimized LGA Power Block”, PD-96987A,, pp. 1-10, Internaltiona IR Rectifier ,WWW.IRF.com.
“iP2003A, Synchronous Buck Multiplase Optimized LGA Power Block”, PD-96987A,, pp. 1-10, Internaltiona IR Rectifier ,WWW.IRF.com (Oct. 19, 2005).

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